Product Overview:
- Fully automated fast IV measurement (Ron, BV, Leakage, Vth, Vsat, etc) for both package and on-wafer devices
- Narrow IV pulse widths (down to 10 μs) to prevent device self-heating for revealing actual device performance
- Oscilloscope view (Time-domain view) to monitor actual voltage/current pulsed waveforms for accurate measurement
- Scalable configuration to add CV and Qg, to expand current range from 20A to 500 A, 1500 A